Finding the Resistivity of Graphene using the van der Pauw method

Loading...
Thumbnail Image
Authors
Graham, Hugh
Issue Date
2023-04-28
Type
Other
Keywords
Scholarship Sewanee 2023 , University of the South , Graphene , Van der Pauw , Resistivity
Abstract
Thin resistivities of conducting and semiconducting materials were measured. The samples are thin films between 15µm and 50m thick, including aluminum, copper, silicon, and graphene. These included rectangles and squares of uniform thickness, as well as other symmetrical shapes that satisfy Van der Paw’s method. This measurement technique allows a straight-forward method for determining the resistance of a square with a set of specific measurements of the resistance of the thin film. Four contacts were made on the edges of each material and the resistance between any two sets of contacts were used to determine the resistance of the square. From this the resistivity of the material is calculated. Samples included squares, rectangles, and squares with holes. The holes, which violate one important criterium for the Van der Pauw method, have been carefully studied by Chenfei Miao, who modeled them using infinite matrices
Citation